Phase Shift Method of Carrier Lifetime Measurements in Semiconductors
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1716029
Reference7 articles.
1. Measurement of Minority Carrier Lifetime and Contact Injection Ratio on Transistor Materials
2. Direct Reading Minority Carrier Lifetime Measuring Apparatus
3. A Measurement of the Velocity of Light
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