Clustering distances critical to metal dimer formation in the secondary ion mass spectra (SIMS) of cesium chloride
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.437373
Reference19 articles.
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5. A new theory of SIMS at metal surfaces
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1. Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS);International Journal of Mass Spectrometry;2005-12
2. Quantitation of major elements with secondary ion mass spectrometry by using M2+-molecular ions;Journal of the American Society for Mass Spectrometry;1998-06-01
3. Static SIMS Detection of Gold and Gold Cyanide Complexes on Carbon Using Crown Ether Enhancement;Analytical Chemistry;1995-07-01
4. SIMS characterization of hetero-isotopic cluster ions of lithium fluoride;Vacuum;1989-01
5. Interfacial reactions and counterion effects in the secondary ion mass spectra of perrhenate salts;International Journal of Mass Spectrometry and Ion Processes;1987-09
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