Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS)-Reference-Cited by-同舟云学术

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Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS)

Published:2005-12 Issue:1-3 Volume:247 Page:28-36
ISSN:1387-3806
Container-title:International Journal of Mass Spectrometry
language:en
Short-container-title:International Journal of Mass Spectrometry

Author:

Van Ham Rita,Van Vaeck Luc,Adriaens Annemie,Adams Freddy,Hodges Brittany,Appelhans Anthony,Groenewold Gary

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation

Reference13 articles.

1. TOF-SIMS: Surface Analysis by Mass Spectrometry,2001

2. Systematization of the Mass Spectra for Speciation of Inorganic Salts with Static Secondary Ion Mass Spectrometry

3. Molecular speciation of inorganic mixtures by Fourier transform laser microprobe mass spectrometry

4. Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids

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1. High irradiance laser ionization mass spectrometry for direct speciation of iron oxides;Journal of the American Society for Mass Spectrometry;2010-07-01

2. Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates;Talanta;2006-03-15

3. The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces;Analytica Chimica Acta;2006-02

4. Current literature in mass spectrometry;Journal of Mass Spectrometry;2006

5. Feasibility of analyzing molecular pigments in paint layers using TOF S–SIMS;Analytical and Bioanalytical Chemistry;2005-11

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