Feasibility of analyzing molecular pigments in paint layers using TOF S

Feasibility of analyzing molecular pigments in paint layers using TOF S–SIMS

Published:2005-11 Issue:6 Volume:383 Page:991-997
ISSN:1618-2642
Container-title:Analytical and Bioanalytical Chemistry
language:en
Short-container-title:Anal Bioanal Chem

Author:

Van Ham Rita,Van Vaeck Luc,Adams Freddy,Adriaens Annemie

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s00216-005-0088-4.pdf

Reference24 articles.

1. Keune K (2005) Binding medium, pigments and metal soaps characterized and localized in paint cross-sections. Dissertation, Molart Report. Archetype, London

2. Creagh DC, Bradley DA (eds) (2000) Radiation in art and archaeology. Elsevier, Amsterdam

3. Ciliberto E, Spoto G (eds) (2000) Modern analytical methods in art and archaeology. Wiley, New York

4. Demortier G, Adriaens A (eds) (2000) Ion beam study of art and archaeological objects, EUR 19218. Office for the Official Publications of the European Union, Luxembourg

5. Janssens K, Van Grieken R (eds) (2004) Non-destructive microanalysis of cultural heritage materials. Elsevier, Amsterdam

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Time‐of‐flight secondary ion mass spectrometry imaging in cultural heritage: A focus on old paintings;Journal of Mass Spectrometry;2022-01

2. Metals and Environment: Chemical Outputs From the Interaction Between Gilded Copper-Based Objects and Burial Soil;Frontiers in Materials;2020-02-18

3. Single-particle analysis of industrial emissions brings new insights for health risk assessment of PM;Atmospheric Pollution Research;2018-07

4. Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09

5. Characterization of ancient Korean pigments by surface analytical techniques;Surface and Interface Analysis;2016-03-07