Research Update: Focused ion beam direct writing of magnetic patterns with controlled structural and magnetic properties-Reference-Cited by-同舟云学术

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Research Update: Focused ion beam direct writing of magnetic patterns with controlled structural and magnetic properties

Published:2018-06 Issue:6 Volume:6 Page:060701
ISSN:2166-532X
Container-title:APL Materials
language:en
Short-container-title:APL Materials

Author:

Urbánek Michal¹²^ORCID,Flajšman Lukáš¹,Křižáková Viola²,Gloss Jonáš³^ORCID,Horký Michal¹,Schmid Michael³^ORCID,Varga Peter¹³

Affiliation:

1. CEITEC BUT, Brno University of Technology, Purkyňova 123, 612 00 Brno, Czech Republic

2. Institute of Physical Engineering, Brno University of Technology, Technická 2, 616 69 Brno, Czech Republic

3. Institute of Applied Physics, TU Wien, 1040 Vienna, Austria

Funder

MEYS CR

Austrian Science Fund

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5029367

Reference23 articles.

1. Magnetic patterning by means of ion irradiation and implantation

2. Planar Patterned Magnetic Media Obtained by Ion Irradiation

3. Exchange-bias instability in a bilayer with an ion-beam imprinted stripe pattern of ferromagnetic/antiferromagnetic interfaces

4. Structural and magnetic modifications of Cr-implanted Permalloy

5. Ion irradiation and thermally induced mixing of CoCrPt∕Cr multilayered films

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