Terahertz ellipsometry study of the soft mode behavior in ultrathin SrTiO3 films-Reference-Cited by-同舟云学术

Terahertz ellipsometry study of the soft mode behavior in ultrathin SrTiO3 films

Published:2016-02 Issue:5 Volume:108 Page:052901
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Marsik P.¹^ORCID,Sen K.¹,Khmaladze J.¹^ORCID,Yazdi-Rizi M.¹,Mallett B. P. P.¹,Bernhard C.¹

Affiliation:

1. Department of Physics and Fribourg Center for Nanomaterials, University of Fribourg, Chemin du Musée 3, CH-1700 Fribourg, Switzerland

Funder

Sciex-NMS ch

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung (SNF)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4940976

Reference45 articles.

1. SrTiO3: An intrinsic quantum paraelectric below 4 K

2. J. Petzelt , S. Kamba , and J. Hlinka , in New Developments in Advanced Functional Ceramics 2007, edited by L. Mitoseriu ( Transworld Res. Net., 2007), Chap. 14, pp. 387–421, ISBN: 81-7895-248-3.

3. Soft-mode hardening in SrTiO3 thin films

4. Far-infrared spectroscopy of a SrTiO3thin film

5. Origin of soft-mode stiffening and reduced dielectric response inSrTiO3thin films

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