Origin of soft-mode stiffening and reduced dielectric response inSrTiO3thin films-Reference-Cited by-同舟云学术

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Origin of soft-mode stiffening and reduced dielectric response inSrTiO3thin films

Published:2002-12-13 Issue:23 Volume:66 Page:
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Ostapchuk T.,Petzelt J.,Železný V.,Pashkin A.,Pokorný J.,Drbohlav I.,Kužel R.,Rafaja D.,Gorshunov B. P.,Dressel M.,Ohly Ch.,Hoffmann-Eifert S.,Waser R.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.66.235406/fulltext

Reference60 articles.

1. Dielectric analysis of intergrated ceramic thin film capacitors

2. Ferroelectricity in thin films: The dielectric response of fiber-textured (BaxSr1−x)Ti1+yO3+z thin films grown by chemical vapor deposition

3. Thickness dependence of dielectric loss in SrTiO3 thin films

4. Epitaxial ferroelectric/superconductor heterostructures

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