Novel fabrication method for nanometer‐scale silicon dots and wires
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.109500
Reference10 articles.
1. Electron energy-loss spectroscopy studies of nanometre-scale structures in alumina produced by intense electron-beam irradiation
2. AlF3—A new very high resolution electron beam resist
3. SiO2 surface defect centers studied by AES
4. Auger electron spectroscopy studies of silicon nitride, oxide, and oxynitride thin films: Minimization of surface damage by argon and electron beams
5. Stability of ionically bonded surfaces in ionizing environments
Cited by 67 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Graphene removal by water-assisted focused electron-beam-induced etching – unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO2 substrates;Beilstein Journal of Nanotechnology;2024-02-07
2. Review of metal-containing resists in electron beam lithography: perspectives for extreme ultraviolet patterning;Journal of Micro/Nanopatterning, Materials, and Metrology;2022-06-02
3. Electron radiation-induced material diffusion and nanocrystallization in nanostructured amorphous CoFeB thin film;Acta Materialia;2018-12
4. Multiband light emission and nanoscale chemical analyses of carbonized fumed silica;Journal of Applied Physics;2018-09-14
5. Phase identification of individual crystalline particles by combining EDX and EBSD: application to workplace aerosols;Analytical and Bioanalytical Chemistry;2018-03-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3