Misfit strain relaxation and dislocation formation in supercritical strained silicon on virtual substrates
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2769751
Reference14 articles.
1. D. Hull and D. J. Bacon, Introduction to Dislocations, 4th ed. (Butterworth-Heinemann, London, 2002), p. 122.
2. Defects in epitaxial multilayers I. Misfit dislocations
3. Strain relaxation kinetics in Si1−xGex/Si heterostructures
4. The Crystallographic Properties of Strained Silicon Measured by X-Ray Diffraction
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