Raman determination of layer stresses and strains for heterostructures and its application to the cubic SiC/Si system
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.341997
Reference34 articles.
1. Generalized formula for curvature radius and layer stresses caused by thermal strain in semiconductor multilayer structures
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4. Elastic calculation of the thermal strains and stresses of the multilayered plate
5. Crystal Interfaces. Part II. Finite Overgrowths
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