The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films-Reference-Cited by-同舟云学术

The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films

Published:2009-09 Issue:5 Volume:106 Page:053503
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Ogurtani Tarik Omer

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3211855

Reference45 articles.

1. Interface morphology development during stress corrosion cracking: Part I. Via surface diffusion

2. On the stability of surfaces of stressed solids

3. R. Haase, Thermodynamics of Irreversible Processes (North-Holland, Amsterdam, 1969), p. 83.

4. E. A. Guggenheim, Thermodynamics, 4th ed. (North-Holland, Amsterdam, 1959), p. 39.

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