Current-induced surface roughness reduction in conducting thin films
Author:
Affiliation:
1. Department of Chemical Engineering, University of Massachusetts, Amherst, Massachusetts 01003-9303, USA
Funder
U.S. Department of Energy (DOE)
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4977024
Reference31 articles.
1. Effect of surface roughness on the universal thermal conductance
2. Effect of surface roughness on thermal conductivity of silicon nanowires
3. Surface roughness and thermal conductivity of semiconductor nanowires: Going below the Casimir limit
4. Surface-roughness contributions to the electrical resistivity of polycrystalline metal films
5. Surface-roughness fractality effects in electrical conductivity of single metallic and semiconducting films
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