Effect of power on interface and electrical properties of SiO2films produced by plasma‐enhanced chemical‐vapor deposition
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.358913
Reference23 articles.
1. Low‐temperature deposition of high‐quality silicon dioxide by plasma‐enhanced chemical vapor deposition
2. Low‐temperature deposition of high‐quality silicon dioxide by plasma‐enhanced chemical vapor deposition
3. Energy Considerations in the Deposition of High‐Quality Plasma‐Enhanced CVD Silicon Dioxide
4. Effect of Power on the Properties of SiO2 Films Produced by Plasma-Enhanced Chemical Vapour Deposition
Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Investigating the mechanism of enhancing interfacial adhesion of SiOx films on GaAs substrates through process optimization;Thin Solid Films;2024-10
2. Analysis of Structural Distribution of Nitrogen-Incorporated Species at the Interface of Silicon Oxide Films on Silicon Using Time-of-Flight Secondary Ion Mass Spectrometry and Poisson Approximation;Analytical Chemistry;2008-07-22
3. Secondary ion species containing nitrogen atoms from plasma-enhanced chemical vapor deposited silicon oxide films on silicon;Applied Surface Science;2008-07
4. Effect of the ion bombardment energy on silicon dioxide films deposited from oxygen/tetraethoxysilane plasmas in a helicon reactor;Thin Solid Films;2005-01
5. Stacked gate insulator of photooxide and PECVD film from SiH4 and N2O for low-temperature poly-Si thin-film transistor;Electronics and Communications in Japan (Part II: Electronics);2003-10-14
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3