Direct monitoring of minority carrier density during light induced degradation in Czochralski silicon by photoluminescence imaging
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4806999
Reference15 articles.
1. H. Fischer and W. Pschunder, inProceedings of the 10th IEEE Photovoltaic Specialists Conference, Palo Alto, CA (IEEE, New York, 1973), p. 404.
2. Electronically activated boron-oxygen-related recombination centers in crystalline silicon
3. Structure and transformation of the metastable boron- and oxygen-related defect center in crystalline silicon
4. The oxygen dimer in Si: Its relationship to the light-induced degradation of Si solar cells?
5. Latent complexes of interstitial boron and oxygen dimers as a reason for degradation of silicon-based solar cells
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