CuGaSe2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1506205
Reference10 articles.
1. Kelvin probe force microscopy
2. Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
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4. Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces
5. High-resolution work function imaging of single grains of semiconductor surfaces
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