Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces-Reference-Cited by-同舟云学术

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Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Published:2000-04 Issue:4 Volume:157 Page:263-268
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Sommerhalter Ch,Glatzel Th,Matthes Th.W,Jäger-Waldau A,Lux-Steiner M.Ch

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference15 articles.

1. High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope

2. Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy

3. High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy

4. Vacuum compatible high‐sensitive Kelvin probe force microscopy

5. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

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2. Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water;Beilstein Journal of Nanotechnology;2022-09-12

3. Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation;Ultramicroscopy;2021-11

4. Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping;Small;2021-07-26

5. Compensating for artifacts in scanning near-field optical microscopy due to electrostatics;APL Photonics;2021-03-01

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