Measurement of built-in electrical potential in III–V solar cells by scanning Kelvin probe microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1573736
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1. Accelerated publication 30.2% efficient GaInP/GaAs monolithic two-terminal tandem concentrator cell
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5. Scanning capacitance microscopy imaging of silicon metal-oxide-semiconductor field effect transistors
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