Mesoscale scanning probe tips with subnanometer rms roughness
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2756997
Reference44 articles.
1. FIELD ION MICROSCOPY
2. Surface Studies by Scanning Tunneling Microscopy
3. Atomic Force Microscope
4. A reverse electrochemical floating-layer technique of SPM tip preparation
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