Leakage current evolution versus dielectric thickness in lead zirconate titanate thin film capacitors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3055416
Reference22 articles.
1. Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics
2. Electrical transport and dielectric breakdown in Pb(Zr,Ti)O3thin films
3. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics, ISAF;Kurasawa M.,2000
4. Wafer level reliability and leakage current modeling of PZT capacitors
5. Leakage Current Characteristics of Lead-Zirconate-Titanate Thin Film Capacitors for Memory Device Applications
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