Border trap characterization in amorphous indium-gallium-zinc oxide thin-film transistors with SiOX and SiNX gate dielectrics
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4824118
Reference28 articles.
1. 6.0-Inch Extended Graphics Array Reflective Liquid Crystal Display Using Oxide Semiconductor Thin Film Transistors for Electronic Paper Display
2. Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
3. Gate-bias stress in amorphous oxide semiconductors thin-film transistors
4. Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors
5. Observation of near-interface oxide traps with the charge-pumping technique
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