Observation of in situ oxidation dynamics of vanadium thin film with ambient pressure X-ray photoemission spectroscopy-Reference-Cited by-同舟云学术

Observation of in situ oxidation dynamics of vanadium thin film with ambient pressure X-ray photoemission spectroscopy

Published:2016-11-28 Issue:20 Volume:120 Page:205305
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Kim Geonhwa,Yoon Joonseok^ORCID,Yang Hyukjun,Lim Hojoon,Lee Hyungcheol,Jeong Changkil^ORCID,Yun Hyungjoong,Jeong Beomgyun,Crumlin Ethan,Lee Jouhahn,Lee Jaeyoung,Ju Honglyoul,Mun Bongjin Simon

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4967994

Reference38 articles.

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4. Mott Transition in Cr-DopedV2O3

5. Mott-Hubbard Metal-Insulator Transition in ParamagneticV2O3: AnLDA+DMFT(QMC)Study

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