Distribution of the critical current density and flux trapping in YBa2Cu3O7−δramp‐edge Josephson junctions
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.111516
Reference16 articles.
1. Fabrication of heteroepitaxial YBa2Cu3O7−x‐PrBa2Cu3O7−x‐YBa2Cu3O7−xJosephson devices grown by laser deposition
2. YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3OxJosephson ramp junctions
3. YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3OxJosephson ramp junctions
4. YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3OxJosephson ramp junctions
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1. Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ films of variable thickness;Journal of Applied Physics;2010-02-15
2. A comparative study of simulated and experimentally obtained nonuniformity in thermal and electrical properties of conducting films;Journal of Applied Physics;2006-10-15
3. Application of near-field scanning microwave microprobe to electrical current density mapping;Applied Physics Letters;2005-06-06
4. Effect of the magnetic-field orientation on the modulation period of the critical current of ramp-type Josephson junctions;Journal of Applied Physics;2001-11
5. Current transport in ramp-type junctions with engineered interface;Journal of Applied Physics;2001-04
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