Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ films of variable thickness-Reference-Cited by-同舟云学术

Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ films of variable thickness

Published:2010-02-15 Issue:4 Volume:107 Page:043905
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Dizon Jonathan R.,Wang Xiang,Wu Judy Z.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3259372

Reference18 articles.

1. High Tc for the power grid

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3. Influence of nickel substrate grain structure on YBa2Cu3O7−x supercurrent connectivity in deformation-textured coated conductors

4. Contactless characterization of melt-textured superconducting junctions using micro-Hall sensor arrays

5. Supercurrent distribution in high-TC superconducting YBa2Cu3O7−y thin films by scanning superconducting quantum interference device microscopy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of Dynamic Behaviors of Low-Level Dissipation at ${\rm YBa}_{2}{\rm Cu}_{3}{\rm O}_{7}$ Grain Boundaries Using Low-Temperature Near-Field Scanning Microwave Microscopy;IEEE Transactions on Applied Superconductivity;2011-06

2. Detection of low-level dissipation and thermal instability in Y Ba2Cu3O7 − δmicrobridges using low temperature near-field scanning microwave microscopy;Superconductor Science and Technology;2010-04-01