Divergent interfacial thermal transport in MoS2/Si heterostructure over optical phonon modes

Author:

Li Dongsheng1ORCID,Huang Xiaona1,Liu Zeyu2,Liu Wenxiang1ORCID,Xu Shen3ORCID,Yue Yanan1ORCID

Affiliation:

1. School of Power and Mechanical Engineering, Wuhan University 1 , Wuhan, Hubei 430072, China

2. School of Physics and Electronics, Hunan University 2 , Changsha, Hunan 410082, China

3. School of Mechanical and Automotive Engineering, Shanghai University of Engineering Science 3 , Shanghai 201620, China

Abstract

Thermal transport within nanostructures is highly confined by interfaces, and non-trivial physics can emerge at boundaries. Theoretical studies have shown that different phonon modes can exhibit varying thermal resistances at interfaces. Experimental observation of these variations, however, is lacking. Using the steady-state Raman thermometry, the E2g1 and A1g vibrational modes of MoS2 were utilized to characterize the thermal transport properties across the MoS2/Si interface. Our results revealed distinct temperature rises associated with different modes, indicating various mode contributions in the interfacial thermal conductance. Combining experimental and numerical simulations, the out-of-plane mode in MoS2 was found to contribute less to the interfacial transport, by 21.5%, attributed to the less variational mode mismatch of the in-plane phonon, compared to the in-plane mode. Furthermore, our results confirmed a 26.9% higher thermal conductivity from the out-of-plane mode than the in-plane one.

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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