Low-temperature, in situ tunable, uniaxial stress measurements in semiconductors using a piezoelectric actuator
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1635963
Reference13 articles.
1. Piezoresistance in Quantized Conduction Bands in Silicon Inversion Layers
2. Piezoresistance in Quantized Conduction Bands in Silicon Inversion Layers
3. Further measurements of the temperature dependence of the voltage response of piezoelectric tube scanner PZT‐5A for use in scanning tunneling microscopes
4. Further measurements of the temperature dependence of the voltage response of piezoelectric tube scanner PZT‐5A for use in scanning tunneling microscopes
5. Further measurements of the temperature dependence of the voltage response of piezoelectric tube scanner PZT‐5A for use in scanning tunneling microscopes
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