Growth and characterization of 10-nm-thick c-axis oriented epitaxial PbZr0.25Ti0.75O3 thin films on (100)Si substrate
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.122824
Reference10 articles.
1. Ferroelectric Memories
2. Formation and observation of 50 nm polarized domains in PbZr1−xTixO3 thin film using scanning probe microscope
3. Characteristics of PZT thin films as ultra-high density recording media
4. Novel ferroelectric epitaxial (Ba,Sr)TiO/sub 3/ capacitor for deep sub-micron memory applications
5. Size Effect on the Phase Transition inPbTiO3Fine Particles
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