Characteristics of PZT thin films as ultra-high density recording media-Reference-Cited by-同舟云学术

Characteristics of PZT thin films as ultra-high density recording media

Published:1997-09 Issue:1-4 Volume:17 Page:319-327
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Hidaka T.¹,Maruyama T.¹,Sakai I.¹,Saitoh M.¹,Wills L. A.²,Hiskes R.²,Dicarolis S. A.²,Amano Jun²,Foster C. M.³

Affiliation:

1. a Hewlett-Packard Laboratories , 3-2-2 Sakado, Takatsu-ku, Kawasaki-shi, 213, Japan

2. b Hewlett-Packard Laboratories , 3500 Deer Creek Road, Palo Alto, CA 94304, USA

3. c Material Science division , Argonne National Laboratory , Argonne, IL, 60439, USA

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589708013006

Reference14 articles.

1. Charge storage in a nitride‐oxide‐silicon medium by scanning capacitance microscopy

2. Local poling of ferroelectric polymers by scanning force microscopy

3. Switching and memory phenomena in Langmuir–Blodgett films with scanning tunneling microscope

4. Fabricating nanoscale structures on Au surface with scanning tunneling microscope

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