Investigation of the importance of interface and bulk limited transport mechanisms on the leakage current of high dielectric constant thin film capacitors-Reference-Cited by-同舟云学术

Investigation of the importance of interface and bulk limited transport mechanisms on the leakage current of high dielectric constant thin film capacitors

Published:2003-11-15 Issue:10 Volume:94 Page:6741-6748
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Baniecki J. D.,Shioga T.,Kurihara K.,Kamehara N.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1620377

Reference49 articles.

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