1. D. V. Lang,Radiation Effects in Semiconductors(The Institute of Physics, London, 1977), Conf. Ser. 31, p. 70.
2. For recent reviews see Ref. 1 and A. Mircea and D. Bois,Defects and Radiation Effects in Semiconductors(The Institute of Physics, London 1979), Conf. Ser. 46, p. 82.
3. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
4. D. V. Lang and L. C. Kimerling, Lattice Defects in Semiconductors, 1974, Inst. Phys. Conf. Ser. 23, p. 5817 (1975).
5. D. Pons, Thesis, Paris, 1979 and see Ref. 25.