New nondestructive depth profile measurement by using a refracted x‐ray fluorescence method
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.104315
Reference8 articles.
1. Refraction effect of scattered X-ray fluorescence at surface
2. Concentration Profile of a Dissolved Polymer near the Air-Liquid Interface: X-Ray Fluorescence Study
3. Morphology of Langmuir-Blodgett multilayers: A near-total external fluorescence and reflectivity study
4. X‐ray near total external fluorescence method: Experiment and analysis
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