Onset of long-range diffusion and exponent of 1/fα noise in metal films with electromigration damage
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1523155
Reference12 articles.
1. 1fNoise and Grain-Boundary Diffusion in Aluminum and Aluminum Alloys
2. Prediction of electromigration failure in W/Al-Cu multilayered metallizations by noise measurements
3. 1/f noise as an early indicator of electromigration damage in thin metal films
4. Electromigration in isolated aluminum vias probed by resistance changes and 1/fnoise
5. Temperature Dependence of the l/f Noise in Heat-Treated Films of Al And Al-Cu
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