Thin film characterization by atom probe field ion microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.90988
Reference21 articles.
1. Nucleation and Epitaxial Growth of Cu on W
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3. Some properties of thin metal films observed by field-ion and field emission microscopy
4. A field-ion microscope study of thin films of iridium on molybdenum
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1. The nano-world of thin films;Journal of Nanophotonics;2008-09-01
2. Studies of solid surfaces at atomic resolution;Surface Science Reports;1988-03
3. The Atomic Structure and Atomic Layer Compositional Analysis of Thin Solid Films Using the Time-of-Flight Atom-Probe Field Ion Microscopy;Treatise on Materials Science & Technology;1988
4. Toward quantification of thin film morphology;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1986-05
5. 7. High-Field Techniques;Methods in Experimental Physics;1985
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