Piezoeffect and gate current in AlGaN/GaN high electron mobility transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.120477
Reference11 articles.
1. A new and simple model for GaAs heterojunction FET gate characteristics
2. Enhanced CAD model for gate leakage current in heterostructure field effect transistors
3. Microwave performance of 0.25 [micro sign]m doped channel GaN/AlGaN heterostructure field effect transistor at elevated temperatures
4. High-temperature performance of AlGaN/GaN HFETs on SiC substrates
5. Photoluminescence characterization of the quantum well structure and influence of optical illumination on the electrical performance of AlGaN/GaN modulation‐doped field‐effect transistors
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1. A theoretical investigation of pyroelectric effect and thermoelectric improvement of AlInN/GaN heterostructures;Thin Solid Films;2019-08
2. Primary pyroelectric transition temperatures of binary nitrides (AlN, GaN and InN);Modern Physics Letters B;2019-02-20
3. Pyroelectric Property of Binary Nitrides (AlN, GaN and InN);International Journal of Thermophysics;2019-01-18
4. Electronic Devices Based on Group III Nitrides ☆;Reference Module in Materials Science and Materials Engineering;2018
5. Gate leakage currents induced by thermal fluctuation on two-dimensional electron gas in AlGaN/GaN high-electron-mobility transistors;Thin Solid Films;2017-02
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