In-situ characterization of O-terminated Cu tips for high-resolution atomic force microscopy
Author:
Affiliation:
1. Institute of Experimental and Applied Physics, University of Regensburg, D-93040 Regensburg, Germany
Funder
Deutsche Forschungsgemeinschaft
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5085747
Reference38 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Atomic Force Microscope
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