A new type of fiber-optic-based interferometric ellipsometer for in situ and real-time measurements
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1606118
Reference7 articles.
1. Interferometric ellipsometry
2. New ultra-fast interferometric ellipsometry systems based on a Zeeman two-frequency laser
3. New ellipsometry realized by the use of a stabilized two-frequency laser
4. Fast self‐compensating ellipsometer
5. Use of an ADP four-crystal electrooptic modulator in ellipsometry
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