An accurate method to check chemical interfaces of epitaxial III‐V compounds
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.92974
Reference6 articles.
1. Depth resolution degradation of sputter‐profiled InP/InxGa1−xAsyP1−yinterfaces caused by cone formation
2. Some considerations of the limitations of the Auger-depth-profiling technique as applied to silver metal and (100) surfaces of indium phosphide
3. The development of surface topography during depth profiling in auger electron spectroscopy
4. Abrupt Ga1−xAlxAs‐GaAs quantum‐well heterostructures grown by metalorganic chemical vapor deposition
5. Minimum Al0.5Ga0.5As‐GaAs heterojunction width determined by sputter‐Auger techniques
Cited by 57 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Low temperature plasma for the preparation of crater walls for compositional depth profiling of thin inorganic multilayers;Surface and Interface Analysis;2016-10-17
2. Low-temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60and giant argon gas cluster sources;Rapid Communications in Mass Spectrometry;2014-08-05
3. A computational study of nonparabolic conduction band effect on quantum wire transport (e.g. GaN);Optical and Quantum Electronics;2013-05-25
4. Effect of band parameters on interband optical absorption in quantum wire structure of low band gap III–V semiconductors;Journal of Computational Electronics;2013-02-21
5. Generalized optical gain analysis in nonparabolic semiconductor laser;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2013-02-14
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3