Principles and applications of elastic scattering with high‐energy protons and heavy ions for quantitative microanalysis of metal surfaces, thin layers, and sandwich structures-Reference-Cited by-同舟云学术

Principles and applications of elastic scattering with high‐energy protons and heavy ions for quantitative microanalysis of metal surfaces, thin layers, and sandwich structures

Published:1976-07 Issue:7 Volume:47 Page:2811-2820
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Müller P.,Ischenko G.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.323077

Reference28 articles.

1. Diffusion Measurements in the System Cu-Au by Elastic Scattering

2. Surface analysis by charged particle spectroscopy

3. The mechanism of anodic oxidation

4. Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

5. Microanalysis of Materials by Backscattering Spectrometry

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1. Stability of semiconducting gallium oxide thin films;Thin Solid Films;1990-09

2. Solid state amorphisation reaction in sputtered and evaporated Ni/Zr multilayer films;Journal of Physics: Condensed Matter;1990-04-09

3. Rutherford backscattering studies of surface density reduction in ion-implanted and excimer-laser-annealed Ge;Journal of Physics and Chemistry of Solids;1987-01

4. Applications of Heavy-Ion Rutherford Backscattering Spectrometry (HIRBS) to the analysis of contact structures on GaAs and Ge;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1985-05

5. A comparative study of methods for thin-film and surface analysis;Reports on Progress in Physics;1984-03-01