Solid state amorphisation reaction in sputtered and evaporated Ni/Zr multilayer films
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/2/i=14/a=002/pdf
Reference33 articles.
1. Diffusivity of Ni in an amorphous Ni-Zr alloy
2. Application of the CALPHAD method for the prediction of amorphous phase formation
3. Short-range order and thermal stability in amorphous alloys
4. Dominant moving species in the formation of amorphous NiZr by solid‐state reaction
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1. Thermal stability of interfacial mixed layers in c-Ni/a-Zr multilayer during annealing: Structural and magnetic properties;Applied Surface Science;2022-01
2. Influence of the deposition method on interdiffusion of Ni/Ag bilayer thin films;Journal of Physics D: Applied Physics;2012-05-01
3. Influence of Ti layer thickness on solid state amorphization and magnetic properties of annealed Ti/Ni multilayer;Journal of Physics: Condensed Matter;2007-08-22
4. Composition analysis of nickel silicide formed from evaporated and sputtered nickel for microsystem devices;Electronics Letters;2007
5. Solid State Amorphisation Reaction in Evaporated Hf/Ag Multilayer Films;physica status solidi (a);2001-04
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