Electronic state characterization of SiOx thin films prepared by evaporation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1927278
Reference38 articles.
1. Characterization of reactively evaporated SiOx thin films
2. Large-range refractive-index control of silicon monoxide antireflection coatings using oblique incident thermal evaporation
3. Optical Properties of Silicon Monoxide in the Wavelength Region from 024 to 140 Microns*
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