General model and segregation coefficient measurement for ultrashallow doping by excimer laser annealing
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1927275
Reference27 articles.
1. Photonic high-frequency capacitance-voltage characterization of interface states in metal-oxide-semiconductor capacitors
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