Structural and electrical damage induced by high‐energy heavy ions in SiO2/Si structures
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.351078
Reference35 articles.
1. Hole photocurrents and electron tunnel injection induced by trapped holes in SiO2 films
2. A Framework for Understanding Radiation-Induced Interface States in SiO2 MOS Structures
3. Damage center formation in SiO2thin films by fast electron irradiation
4. Radiation damage in vitreous fused silica induced by MeV ion implantation
5. Electron‐spin‐resonance study of radiation‐induced paramagnetic defects in oxides grown on (100) silicon substrates
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