Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry
Author:
Funder
NSF
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4883228
Reference13 articles.
1. Individual charge traps in silicon nanowires
2. Background charges and quantum effects in quantum dots transport spectroscopy
3. Application of negative differential conductance in Al/AlOx single-electron transistors for background charge characterization
4. Single-dopant resonance in a single-electron transistor
5. Impedance analysis of a radio-frequency single-electron transistor
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