Individual charge traps in silicon nanowires-Reference-Cited by-同舟云学术

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Individual charge traps in silicon nanowires

Published:2006-12 Issue:3 Volume:54 Page:299-307
ISSN:1434-6028
Container-title:The European Physical Journal B
language:en
Short-container-title:Eur. Phys. J. B

Author:

Hofheinz M.,Jehl X.,Sanquer M.,Molas G.,Vinet M.,Deleonibus S.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1140/epjb/e2006-00452-x.pdf

Reference42 articles.

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2. B.E. Kane, Nature 393, 133 (1998)

3. J.M. Elzerman, R. Hanson, L.H.W. van Beveren, B. Witkamp, L.M.K. Vandersypen, L.P. Kouwenhoven, Nature 430, 431 (2004)

4. J. Gorman, D.G. Hasko, D.A. Williams, Phys. Rev. Lett. 95, 090502 (2005)

5. P. Lafarge, H. Pothier, E.R. Williams, D. Estève, C. Urbina, M.H. Devoret, Z. Phys. B 85, 327 (1991)

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