Sensitivity comparison of two-photon vs three-photon Rydberg electrometry
Author:
Affiliation:
1. National Institute of Standards and Technology 1 , Boulder, Colorado 80305, USA
2. Department of Physics, University of Colorado Boulder 2 , Boulder, Colorado 80309, USA
3. ColdQuanta 3 , Boulder, Colorado 80301, USA
Abstract
Funder
Defense Advanced Research Projects Agency
National Institute of Standards and Technology
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/5.0147827/18038301/023101_1_5.0147827.pdf
Reference45 articles.
1. Microwave electrometry with Rydberg atoms in a vapour cell using bright atomic resonances;Nat. Phys.,2012
2. Atom-based RF electric field metrology: From self-calibrated measurements to subwavelength and near-field imaging;IEEE Trans. Electromagn. Compat.,2017
3. Electric field metrology for Si traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor;J. Appl. Phys.,2017
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