Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor
Author:
Affiliation:
1. National Institute of Standards and Technology (NIST), Boulder, Colorado 80305, USA
2. Rydberg Technologies, LLC, Ann Arbor, Michigan 48109, USA
3. Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA
Funder
NFS
NIST: Embedded Standards Program
Defense Advanced Research Projects Agency (DARPA)
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/am-pdf/10.1063/1.4984201
Reference20 articles.
1. Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging
2. Broadband Rydberg Atom-Based Electric-Field Probe for SI-Traceable, Self-Calibrated Measurements
3. Microwave electrometry with Rydberg atoms in a vapour cell using bright atomic resonances
4. Sub-wavelength imaging and field mapping via electromagnetically induced transparency and Autler-Townes splitting in Rydberg atoms
5. Millimeter wave detection via Autler-Townes splitting in rubidium Rydberg atoms
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