Automated polarimeter–macroscope for optical mapping of birefringence, azimuths, and transmission in large area wafers. Part I. Theory of the measurement-Reference-Cited by-同舟云学术

Automated polarimeter–macroscope for optical mapping of birefringence, azimuths, and transmission in large area wafers. Part I. Theory of the measurement

Published:1995-04 Issue:4 Volume:66 Page:2977-2990
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Bajor Andrzej L.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1145584

Reference28 articles.

1. Infrared Studies of Birefringence in Silicon

2. INFRARED BIREFRINGENCE OBSERVATIONS ON ELECTRON‐BOMBARDED SILICON

3. Effect of Growth Parameters on the Residual Stress and Dislocation Density of Czochralski‐Grown Silicon Crystals

4. Characterization of growth cells in In-doped GaP crystals by birefringent method

5. Liquid encapsulated Czochralski growth of 35 mm diameter single crystals of GaP

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