Observation of degradation processes of Al electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy-Reference-Cited by-同舟云学术

Observation of degradation processes of Al electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy

Published:1994-11 Issue:9 Volume:76 Page:5118-5121
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Do L. M.,Han E. M.,Niidome Y.,Fujihira M.,Kanno T.,Yoshida S.,Maeda A.,Ikushima A. J.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.357224

Reference12 articles.

1. Transients of Volume‐Controlled Current and of Recombination Radiation in Anthracene

2. Organic electroluminescent diodes

3. Electroluminescence of doped organic thin films

4. Bright blue electroluminescence from hole transporting polycarbonate

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