Capacitance Measurement for Evaluating the Initial Top-Electrode-Damage-Induced Degradation of Organic Devices-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Capacitance Measurement for Evaluating the Initial Top-Electrode-Damage-Induced Degradation of Organic Devices

Published:2024-08-06 Issue:9 Volume:6 Page:4090-4097
ISSN:2639-4979
Container-title:ACS Materials Letters
language:en
Short-container-title:ACS Materials Lett.

Author:

Zhu Chunqin¹²^ORCID,Zhu Guangrui¹²^ORCID,Zhao Ya³^ORCID,Yi Ruichen¹²^ORCID,Hou Xiaoyuan¹²^ORCID,Qin Jiajun⁴^ORCID

Affiliation:

1. State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China

2. Key Laboratory of Micro and Nano Photonic Structures (Ministry of Education), Fudan University, Shanghai 200433, China

3. Physikalisches Institut, Ruprecht-Karls-Universität Heidelberg, Heidelberg 69120, Germany

4. Department of Physics, Chemistry and Biology (IFM), Linköping University, Linköping 58183, Sweden

Funder

National Natural Science Foundation of China

Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsmaterialslett.4c01103

Reference37 articles.

1. From scalable solution fabrication of perovskite films towards commercialization of solar cells

2. Organic Solar Cells—The Path to Commercial Success

3. Renewed Prospects for Organic Photovoltaics

4. Organic Light‐Emitting Diodes: Organic Light‐Emitting Diodes: Pushing Toward the Limits and Beyond (Adv. Mater. 35/2020)

5. Impact of Planar and Vertical Organic Field‐Effect Transistors on Flexible Electronics

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP