Quantification of atom‐probe FIM data and an application to the investigation of surface segregation of alloys
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.89892
Reference13 articles.
1. The Atom‐Probe Field Ion Microscope
2. An FIM-atom probe study of the precipitation of copper from lron-1.4 at. pct copper. Part I: Field-ion microscopy
3. An FIM-atom probe study of the precipitation of copper from lron-1.4 at. pct copper. Part I: Field-ion microscopy
4. An FIM-atom probe study of the precipitation of copper from lron-1.4 at. pct copper. Part I: Field-ion microscopy
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