Exploring the accuracy of isotopic analyses in atom probe mass spectrometry-Reference-Cited by-同舟云学术

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Exploring the accuracy of isotopic analyses in atom probe mass spectrometry

Published:2020-09 Issue: Volume:216 Page:113018
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Meisenkothen Frederick,Samarov Daniel V.,Kalish Irina,Steel Eric B.

Funder

National Institute of Standards and Technology

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference71 articles.

1. Nanoscale measurement of laser-induced temperature rise and field evaporation effects in CdTe and GaN;Diercks;J. Phys. Chem. C,2015

2. Atom probe tomography evaporation behavior of c-axis GaN nanowires: crystallographic, stoichiometric, and detection efficiency aspects;Diercks;J. Appl. Phys.,2013

3. Atom probe tomography analysis of the reference zircon gj-1: an interlaboratory study;Exertier;Chem. Geol.,2018

4. Quantitative analysis of carbon in cementite using pulsed laser atom probe;Kitaguchi;Ultramicroscopy,2014

5. Atom probe tomography analysis of bulk chemistry in mineral standards;Laiginhas;Microsc. Microanal.,2015

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1. Atom probe tomography investigation of highly-enriched 28Si crystal;Microchemical Journal;2024-11

2. Microscopic correlation of doping distribution and luminescence in a nitride laser junction by Photonic Atom Probe;Physical Review Materials;2024-07-18

3. Towards Improved Measurement of Chemical Composition and Isotope Ratios of Rare-earth Phosphates in Atom Probe Tomography;Microscopy and Microanalysis;2024-07

4. Geochemical Quantification of Olivine Minerals by Atom Probe Tomography;Microscopy and Microanalysis;2024-07

5. Ranging Atom Probe Spectra to Reduce Measurement Bias;Microscopy and Microanalysis;2024-07

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